Mo-pecvd (metal-organic Plasma Enhanced Chemical Vapour Deposition) of Erbium-doped Hydrogenated and Deuterated Amorphous Carbon

نویسنده

  • Raymond Tsai
چکیده

Erbium (Er) ion has been widely used in silica fiber-based active photonic devices, given its characteristic emission around 1.5 μm. Hydrogenated and deuterated amorphous carbon (a-C:H and a-C:D, respectively), thin film materials offering tailorable opto-electronic properties, have not been explored thoroughly as host materials for Er. The objective of this research is to study the potential suitability of a-C:H and a-C:D as Er hosts for 1.54 μm light emitting applications. Erbium-doped hydrogenated amorphous carbon (a-C:H(Er)) is fabricated through controlled thermal evaporation of metal-organic compounds in a hydrocarbon discharge generated by the DC saddle-field plasma enhanced chemical vapour deposition system. Er photoluminescence (PL) is successfully demonstrated for the first time in Er-doped deuterated amorphous carbon (a-C:D(Er)). Uniform distribution of optically active Er ions is attained by using tris(2,2,6,6-tetramethy1-3-5-heptanedionate)Erbium(III) (Er(thd)3) compound as revealed by XPS analysis. Er(thd)3 is observed to be a preferred dopant over Erbium(III) 2,4-pentanedionate (Er(acac)3). Deuteration of amorphous carbon has effectively removed the PL quenching effect caused by non-radiative C-H and O-H vibrational transitions. An improvement factor of ~ 4.4 is observed in the minimum doping level of Er required to attain PL in a-C:D(Er), compared to a-C:H(Er). The results of this thesis suggest that a-C:D(Er) material can potentially be used for silicon-compatible opto-electronics applications in 1.5 μm region.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Room-temperature photoluminescence in erbium-doped deuterated amorphous carbon prepared by low-temperature MO-PECVD.

We report on a novel optical thin film material, erbium-doped deuterated amorphous carbon, fabricated directly on silicon substrate at room-temperature via controlled thermal evaporation of a Metal-Organic compound in a Plasma-Enhanced Chemical Vapour Deposition (MO-PECVD) system. High erbium concentrations (up to 2.3 at.%) and room-temperature photoluminescence at 1.54 microm are successfully ...

متن کامل

Characterization of Strain Induced by PECVD Silicon Nitride Films in Transistor Channel

In order to reach high level of transistor performances, it is desirable to increase electrical conductivity of the device. An efficient way to enhance carrier mobility in conduction channel is to generate strain in the structure induced by process. To achieve that, stress engineering of the contact etch stop layer (CESL), an amorphous hydrogenated silicon nitride film deposited by plasma enhan...

متن کامل

Boron Doping of Hydrogenated Amorphous Silicon Prepared by rf-co-Sputtering

This paper addresses the doping mechanism of amorphous semiconductors through the investigation of boron doped rf co-sputtered amorphous hydrogenated silicon. The activation energy and room temperature conductivity varied from 0.9 to 0.3 eV and from 10 12 to 10 4 Ohm .cm , respectively, by ranging the boron concentration from 0 to 3 at.%. These ranges of electronic properties are of the same or...

متن کامل

Plasma enhanced chemical vapor deposition of deuterated diamond like carbon films for photocathode application

The influence of diamond like carbon films properties on quantum efficiency of prepared transmission photocathodes has been investigated. DLC films were deposited on silicon substrate and stainless steel mesh by PECVD using methane, argon and hydrogen or deuterium gas mixtures. Photocathodes prepared with deuterated DLC film have higher quantum efficiency than photocathodes prepared with hydrog...

متن کامل

Photoluminescence properties of erbium doped InGaN epilayers

We report on the photoluminescence properties of erbium Er doped InxGa1−xNa epilayers synthesized by metal organic chemical vapor deposition. The crystalline quality and surface morphology of Er doped In0.05Ga0.95N were nearly identical to those of Er doped GaN. The photoluminescence intensity of the 1.54 m emission in Er doped In0.05Ga0.95N was an order of magnitude lower than in Er doped GaN ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009